fcbatera
(usa Debian)
Enviado em 19/03/2017 - 19:32h
saida do smartctl:
smartctl 6.4 2014-10-07 r4002 [x86_64-linux-3.16.0-4-amd64] (local build)
Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Toshiba 2.5" HDD MK..55GSX
Device Model: TOSHIBA MK1655GSX
Serial Number: X995S4USS
LU WWN Device Id: 5 000039 215802741
Firmware Version: FG011J
User Capacity: 160,041,885,696 bytes [160 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS (minor revision not indicated)
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Sun Mar 19 19:25:14 2017 BRT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 73) minutes.
SCT capabilities: (0x0039) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 998
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 2365
5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 037 037 000 Old_age Always - 25299
10 Spin_Retry_Count 0x0033 147 100 030 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 2262
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 29778
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 243
193 Load_Cycle_Count 0x0032 072 072 000 Old_age Always - 282138
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 51 (Min/Max 12/68)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 0
220 Disk_Shift 0x0002 100 100 000 Old_age Always - 80
222 Loaded_Hours 0x0032 059 059 000 Old_age Always - 16478
223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0
224 Load_Friction 0x0022 100 100 000 Old_age Always - 0
226 Load-in_Time 0x0026 100 100 000 Old_age Always - 334
240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0
SMART Error Log Version: 1
ATA Error Count: 10 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 10 occurred at disk power-on lifetime: 807 hours (33 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 0a 08 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x0000080a = 2058
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d0 01 0a 08 00 e0 00 00:01:52.597 READ DMA EXT
29 d0 01 09 08 00 e0 00 00:01:48.071 READ MULTIPLE EXT
25 d0 01 09 08 00 e0 00 00:01:43.545 READ DMA EXT
29 d0 01 08 08 00 e0 00 00:01:39.020 READ MULTIPLE EXT
25 d0 01 08 08 00 e0 00 00:01:34.494 READ DMA EXT
Error 9 occurred at disk power-on lifetime: 807 hours (33 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 09 08 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000809 = 2057
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d0 01 09 08 00 e0 00 00:01:43.545 READ DMA EXT
29 d0 01 08 08 00 e0 00 00:01:39.020 READ MULTIPLE EXT
25 d0 01 08 08 00 e0 00 00:01:34.494 READ DMA EXT
29 d0 01 07 08 00 e0 00 00:01:29.968 READ MULTIPLE EXT
25 d0 01 07 08 00 e0 00 00:01:25.442 READ DMA EXT
Error 8 occurred at disk power-on lifetime: 807 hours (33 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 08 08 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000808 = 2056
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d0 01 08 08 00 e0 00 00:01:34.494 READ DMA EXT
29 d0 01 07 08 00 e0 00 00:01:29.968 READ MULTIPLE EXT
25 d0 01 07 08 00 e0 00 00:01:25.442 READ DMA EXT
29 d0 01 06 08 00 e0 00 00:01:20.917 READ MULTIPLE EXT
25 d0 01 06 08 00 e0 00 00:01:16.391 READ DMA EXT
Error 7 occurred at disk power-on lifetime: 807 hours (33 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 07 08 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000807 = 2055
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d0 01 07 08 00 e0 00 00:01:25.442 READ DMA EXT
29 d0 01 06 08 00 e0 00 00:01:20.917 READ MULTIPLE EXT
25 d0 01 06 08 00 e0 00 00:01:16.391 READ DMA EXT
29 d0 01 05 08 00 e0 00 00:01:11.865 READ MULTIPLE EXT
25 d0 01 05 08 00 e0 00 00:01:07.340 READ DMA EXT
Error 6 occurred at disk power-on lifetime: 807 hours (33 days + 15 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 01 06 08 00 e0 Error: ICRC, ABRT 1 sectors at LBA = 0x00000806 = 2054
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 d0 01 06 08 00 e0 00 00:01:16.391 READ DMA EXT
29 d0 01 05 08 00 e0 00 00:01:11.865 READ MULTIPLE EXT
25 d0 01 05 08 00 e0 00 00:01:07.340 READ DMA EXT
29 d0 01 04 08 00 e0 00 00:01:02.814 READ MULTIPLE EXT
25 d0 01 04 08 00 e0 00 00:00:58.288 READ DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.